WFU Department of Physics Wake Forest University

 

Wake Forest Physics
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WFU Physics Colloquium

TITLE: Measurements to Enable Emerging Nanoelectronics

SPEAKER: Dr. Curt A. Richter,

NanoElectronics Group,
Semiconductor & Dimensional Metrology Division,
Physical Measurement Laboratory,
National Institute of Standards and Technology

TIME: Wednesday November 20, 2013 at 4:00

PLACE: Room 101 Olin Physical Laboratory



Refreshments will be served at 3:30 PM in the Olin Lounge. All interested persons are cordially invited to attend.

ABSTRACT

Traditional computing devices have been based upon the scaling of silicon-based complementary metal oxide semiconductor (CMOS) devices, but this scaling is reaching fundamental limits. The semiconductor industry is facing difficult challenges extending integrated circuit technology performance, and innovative technologies to store and manipulate are being aggressively pursued. These emerging technologies rely on the integration of novel materials such as graphene, nanowires, and compound semiconductors as well as new device structures such as tunnel-FETs and resistance change memories. New measurements are needed to enable research, development, and the eventual manufacture of advanced electronics. The Nanoelectronics Group at NIST is working to advance the optical and electrical measurement science infrastructure necessary for innovation in future nanoelectronic and thin-film devices, and their component materials. I will present some examples of novel nanoelectronic devices such as those based on graphene, semiconductor nanowires, and molecular materials. I will also discuss the critical need for correlations of the final device performance with the results of characterization of the underlying physical properties of the structures.



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100 Olin Physical Laboratory
Wake Forest University
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